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Visual inspection device and process

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专利名称:Visual inspection device and process发明人:John J. Staudt, III申请号:US07/792813申请日:19911115公开号:US05260780A公开日:19931109

摘要:A vision inspection system capable of high resolution of distanced portions ofthe same part is provided, allowing for dimensional calculations to be made on largeparts with high resolution. A process for inspection of a part is provided, comprising thesteps of: mapping a first portion of the part; mapping a second portion of the part;defining a first reference coordinate corresponding to a first reference point located onthe first portion of the part; defining a second reference coordinate corresponding to asecond reference point located on the second portion of the part; determining thenumber of coordinates between the first reference coordinate and the second referencecoordinate; calculating a constant corresponding to a third portion of the part, whereinthe third portion of the part is not mapped; and adding the constant to the number ofcoordinates between the first and the second reference coordinates.

申请人:THREADMASTERS, INC.

代理人:Gordon T. Arnold,John R. Kirk, Jr.

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