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专利名称：Immunity to inline charging damage in circuit
designs
发明人：Zachary Henderson,Jason D.
Hibbeler,Terence B. Hook,NicholasPalmer,Kirk D. Peterson
申请号：US14707576申请日：20150508公开号：US09378329B1公开日：20160628
专利附图：
摘要：Approaches for checking a design of an integrated circuit using an antenna rule
are provided. A method includes determining a figure of merit for a transistor based on aresistance of a shunt path of the transistor relative to the size of the antenna and the sizeof the transistor. The method also includes comparing the determined figure of merit toa limit. The method further includes deeming the transistor to pass the antenna rulewhen the figure of merit is less than the limit, and deeming the transistor to fail theantenna rule when the figure of merit is greater than the limit. The determining and thecomparing are performed by a computer device.
申请人：INTERNATIONAL BUSINESS MACHINES CORPORATION
地址：Armonk NY US
国籍：US
代理机构：Roberts Mlotkowski Safran & Cole, P.C.
代理人：Steven J. Meyers
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