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专利名称：Adaptive Test Sequence for Testing
Integrated Circuits
发明人：Chun-Cheng Chen,Hung-Chih Lin,Mill-Jer
Wang,Hao Chen,Ching-Nen Peng
申请号：US13072325申请日：20110325
公开号：US20120246514A1公开日：20120927
专利附图：
摘要：A method includes testing a first device and a second device identical to eachother and comprising integrated circuits. The testing of the first device is performed
according to a first test sequence of the first device, wherein the first test sequenceincludes a plurality of ordered test items, and wherein the first test sequence includes atest item. A test priority of the test item is calculated based on a frequency of fails of thetest item in the testing of a plurality of devices having an identical structure as the firstdevice. The first test sequence is then adjusted to generate a second test sequence inresponse to the test priority of the test item, wherein the second test sequence isdifferent from the first test sequence. The second device is tested according to thesecond test sequence.
申请人：Chun-Cheng Chen,Hung-Chih Lin,Mill-Jer Wang,Hao Chen,Ching-Nen Peng
地址：Hsin-Chu TW,Hsin-Chu TW,Hsin-Chu TW,Luzhou City TW,Hsin-Chu TW
国籍：TW,TW,TW,TW,TW
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